OBIRCH analysis
「OBIRCH analysis」熱門搜尋資訊
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「OBIRCH analysis」文章包含有:「ElectricalFailureAnalysis(EFA)」、「OBIRCH」、「OBIRCH」、「OpticalBeamInducedResistanceChange(OBIRCH)」、「Thermallaserstimulation」、「雷射光束電阻異常偵測(OBIRCH)」、「電性故障分析(EFA)」
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Electrical Failure Analysis (EFA)
https://www.matek.com
The Infrared Optical Beam Induced Resistance Change(IR OBIRCH), is a failure analysis tool used to detect IR illumination induced resistance changes. It uses ...
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OBIRCH
https://en.msscorps.com
OBIRCH Analysis detects fluctuation in electricity that occur when an infrared laser is irradiated to find leakage current paths and contact area resistance ...
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OBIRCH
https://www.msscorps.com
OBIRCH Analysis detects fluctuation in electricity that occur when an infrared laser is irradiated to find leakage current paths and contact area resistance ...
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Optical Beam Induced Resistance Change (OBIRCH)
https://www.istgroup.com
The Optical Beam Induced Resistance Change (OBIRCH) scans an IC surface (either front or back) with a laser beam during the IC function test period.
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Thermal laser stimulation
https://en.wikipedia.org
This technique may be used for semiconductor failure analysis. There ... (OBIRCH), thermally induced voltage alteration (TIVA)), external ...
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雷射光束電阻異常偵測(OBIRCH)
https://www.istgroup.com
雷射光束電阻異常偵測(Optical Beam Induced Resistance Change,以下簡稱OBIRCH),以雷射光在IC表面進行掃描,在IC功能測試期間,OBIRCH 利用雷射掃瞄IC 內部連接位置 ...
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電性故障分析(EFA)
https://www.matek.com
We provide wide span of materials, structure analysis, surface analysis, failure analysis, and reliability test. ... OBIRCH. 技術原理. IR-OBIRCH 的全名為 ...